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Saved by uncleflo on October 28th, 2013.
Surface recombination can have a major impact both on the short-circuit current and on the open-circuit voltage. High recombination rates at the top surface have a particularly detrimental impact on the short-circuit current since top surface also corresponds to the highest generation region of carriers in the solar cell. Lowering the high top surface recombination is typically accomplished by reducing the number of dangling silicon bonds at the top surface by using "passivating" layer on the top surface. The majority of the electronics industry relies on the use of a thermally grown silicon dioxide layer to passivate the surface due to the low defect states at the interface1. For commercial solar cells, dielectric layers such as silicon nitride are commonly used.
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